Upgrades
Detection systems for scanning electron microscopy (SEM)
We upgrade pre-existing scanning electron microscopes by installing a system for X-ray microspot analysis with digital image aquisition and modern multi element mapping functions. Simple upgrades of older instruments to digital image aquistion and processing are also possible.
EDX/EDS
EUMEX® EDX detectors and the WinEDS® software package are the perfect choice for retrofitting your REM or TEM. WinEDS® is a software package utilizing a digital pulse processor on a PCI card. Works with nearly all common EDX detector systems.
Research & Development Services
Customized electron optics
We design and produce miniaturized electron optical components, which can be machined or even lithographically structured. These components can be combined into more complex lens systems adapted specifically to your needs. Some examples include miniaturized electron guns or scanning electron microscopes.
EDX analysis
We perform Energy Dispersive X-ray spectroscopy in combination with REM for a spatially resolved analysis of the elemental composition of your samples.
UHV acceptance tests
This covers residual gas/outgassing analysis and related activities.
